Request a Quote on Texas Instruments Inc Part B4010111 with the NSN 5962-01-137-9284

Part Number: B4010111

Manufacturer: Texas Instruments Inc

NSN: 5962-01-137-9284

NIIN: 011379284

Item Name : Microcircuit Digital

CAGE Code: 01295

FSC: 5962 Microcircuits Electronic

FSG: 59 Electrical and Electronic Equipment Components

Country : USA

NCB Code : 01

Thank you for taking interest in Texas Instruments Inc part number B4010111, which is listed with the NSN 5962-01-137-9284 and a product description of “Microcircuit Digital.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.

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NSN Information for Part Number B4010111 with NSN 5962-01-137-9284, 5962011379284

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-137-9284 Item Description: MICROCIRCUIT,DIGITAL	5962	011379284		N
	CIIC	HCC	ESD	PMIC	Criticality	ENAC

Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
B4010111	3	2	5

Characteristics Data of NSN 5962-01-137-9284, 5962011379284

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.745 INCHES MINIMUM AND 0.770 INCHES MAXIMUM"
ADAT	BODY WIDTH	0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM"
ADAU	BODY HEIGHT	0.055 INCHES MINIMUM AND 0.140 INCHES MAXIMUM"
AEHX	MAXIMUM POWER DISSIPATION RATING	200.0 MILLIWATTS"
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS"
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS"
CBBL	FEATURES PROVIDED	MONOLITHIC AND HERMETICALLY SEALED AND BURN IN AND HIGH VOLTAGE"
CQSJ	INCLOSURE MATERIAL	CERAMIC"
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE"
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC"
CQZP	INPUT CIRCUIT PATTERN	QUAD 2 INPUT"
CZEQ	TIME RATING PER CHACTERISTIC	100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT"
TEST	TEST DATA DOCUMENT	56996-B4010111 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA"
ADAQ	BODY LENGTH	0.745 INCHES MINIMUM AND 0.770 INCHES MAXIMUM"
ADAT	BODY WIDTH	0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM"
ADAU	BODY HEIGHT	0.055 INCHES MINIMUM AND 0.140 INCHES MAXIMUM"
AEHX	MAXIMUM POWER DISSIPATION RATING	200.0 MILLIWATTS"
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS"
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS"
CBBL	FEATURES PROVIDED	MONOLITHIC AND HERMETICALLY SEALED AND BURN IN AND HIGH VOLTAGE"
CQSJ	INCLOSURE MATERIAL	CERAMIC"
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE"
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC"
CQZP	INPUT CIRCUIT PATTERN	QUAD 2 INPUT"
CZEQ	TIME RATING PER CHACTERISTIC	100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT"
TEST	TEST DATA DOCUMENT	56996-B4010111 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA"