Thank you for taking interest in Solid State Devices Inc part number 1N6657LTXV, which is listed with the NSN 5961-01-391-3735 and a product description of “Semiconductor Devices Unitized.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-01-391-3735 Item PartTypeName: SEMICONDUCTOR DEVICES,UNITIZED | 5961 | 013913735 | 0 | N | A | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | A | G | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
PRD3099 | 5 | 9 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC |
ABMK | OVERALL WIDTH | 0.545 INCHES MAXIMUM |
ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | TO-254AA |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 100.0 MAXIMUM REVERSE VOLTAGE,INSTANTANEOUS ALL SEMICONDUCTOR DEVICE DIODE AND 100.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE ALL SEMICONDUCTOR DEVICE DIODE |
TEST | TEST DATA DOCUMENT | 35351-171280 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWI |
PMLC | PRECIOUS MATERIAL AND LOCATION | TERMINAL AREAS IAW MIL-STD-2000 PARA. 5.4.17.2 GOLD |
PRMT | PRECIOUS MATERIAL | GOLD |
TTQY | TERMINAL TYPE AND QUANTITY | 3 PIN |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR |
CTQX | CURRENT RATING PER CHARACTERISTIC | 40.00 AMPERES FORWARD CURRENT,AVERAGE ABSOLUTE ALL SEMICONDUCTOR DEVICE DIODE AND 400.00 AMPERES FORWARD CURRENT,AVERAGE PRESET ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS JUNCTION |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.990 INCHES MAXIMUM |
ABKW | OVERALL HEIGHT | 0.560 INCHES MAXIMUM |
AKPV | MOUNTING FACILITY QUANTITY | 4 |
ASCK | RESPONSE TIME | 35.0 NANOSECONDS MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | TERMINAL AND UNTHREADED HOLE |
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