Thank you for taking interest in Rockwell Collins Aerospace part number SV258-0147-010, which is listed with the NSN 5962-01-372-5546 and a product description of “Microcircuit Memory.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-372-5546 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013725546 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
Y | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
SV258-0147-010 | 5 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.270 INCHES MINIMUM AND 1.290 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.590 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
FEAT | SPECIAL FEATURES | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL; SELECTED ITEM MADE FROM RC258-0147-010 CAGE 95105,RESCREENED FROM 995-9501-020 CAGE 95105,WHICH IS IDT71681SA-45DBRT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | BURN IN,MIL-STD-883,CLASS B AND COMPATIBLE CMOS AND ELECTROSTATIC SENSITIVE AND HIGH SPEED AND HERMETICALLY SEALED AND OPEN DRAIN |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,DIGITAL,MEMORY; MICROCIRCUIT,RESCREENED |
CZER | MEMORY DEVICE TYPE | ROM |
NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
ADAU | BODY HEIGHT | 0.205 INCHES MINIMUM AND 0.225 INCHES MAXIMUM |
AGAV | END ITEM IDENTIFICATION | MILSTAR |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
CTQX | CURRENT RATING PER CHARACTERISTIC | 50.00 MICROAMPERES NOMINAL INPUT |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
SPCL | SPECIAL TEST FEATURES | SELECTED AND TESTED FOR WAFER LOT HARDNESS |
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