Thank you for taking interest in Integrated Device Technology Inc part number IDT72103L35J, which is listed with the NSN 5962-01-519-5479 and a product description of “Microcircuit Memory.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-519-5479 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 015195479 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
356A1409P14 | 5 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
CZEN | Voltage Rating And Type Per Characteristic | 5.0 VOLTS NOMINAL POWER SOURCE AND 2.0 VOLTS MINIMUM INPUT LOGIC 1 AND 0.8 VOLTS MAXIMUM INPUT LOGIC 0 |
CZER | Memory Device Type | FIRST-IN FIRST-OUT |
FEAT | Special Features | CMOS PARALLEL/SERIAL FIFO USING 5O MHZ SERIAL INPUT/OUTPUT FREQUENCY |
CZZZ | Memory Capacity | 2048WORDSX9BITS |
CQZP | Input Circuit Pattern | 9 INPUT AND 13 INPUT |
CBBL | Features Provided | ELECTROSTATIC SENSITIVE AND HIGH SPEED AND LOW POWER AND INTERNALLY COMPENSATED AND EXPANDABLE AND ASYNCHRONOUS AND SELECTED ITEM |
TTQY | Terminal Type And Quantity | 44 J-HOOK |
CQSJ | Inclosure Material | PLASTIC |
CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT, PLASTIC ENCAPSULATED (SURFACE MOUNT) - PROCUREMENT AND SELECTION REQUIREMENTS (FOR SERIAL FIFO) |
ADAT | Body Width | 0.653 INCHES NOMINAL |
SPCL | Special Test Features | IDT42103L35J IS 100 PERCENT UPSCREENED PER PARA 3.1.1 OF DWG 89954/356A1407 BY APPROVED TEST FACILITY PIKES PEAK TEST LAB OR AMKOR TEST SERVICE FOR OPERATION IN TEMPERATURES OF -55C TO +125C. |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
CQSZ | Inclosure Configuration | LEADED CHIP CARRIER |
ADAQ | Body Length | 0.653 INCHES NOMINAL |
ADAU | Body Height | 0.172 INCHES NOMINAL |
AGAV | End Item Identification | C-17A |
CTFT | Case Outline Source And Designator | MS-018-AC JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
MRC | Decoded Requirement | Clear Text Reply |
CRTL | Criticality Code Justification | CBBL |
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