Request a Quote on Huntron Inc Part TRACKER-2000 with the NSN 6625-01-287-3379

Part Number: TRACKER-2000

Alternate P/N: TRACKER2000

Manufacturer: Huntron Inc

NSN: 6625-01-287-3379

NIIN: 012873379

Item Name : Test Set Electronic

CAGE Code: 57705

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country : USA

NCB Code : 01

Thank you for taking interest in Huntron Inc part number TRACKER-2000, which is listed with the NSN 6625-01-287-3379 and a product description of “Test Set Electronic.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.

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Alongside part number TRACKER-2000, you are encouraged to continue exploring our collection curated catalogs to find additional items that can accompany this Test Set Electronic part with the NSN 6625-01-287-3379. For example, you can browse other Huntron Inc components that were produced under CAGE Code 57705 or listings that belong to FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments with ease on our website, with search tools provided for quick location. Furthermore, our staff is just a call or email away from assisting you with any inquiries or requests, so be sure to get started on the quotation process for part number TRACKER-2000 and other desired offerings on Aerospace Spare.

Characteristics Data of NSN 6625-01-287-3379, 6625012873379

MRC	Criteria	Characteristic
TEXT	GENERAL CHARACTERISTICS ITEM DESCRIPTION	FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT
ZZZW	DEPARTURE FROM CITED DOCUMENT	PEACETIME DEMAND OBTAIN
CXCY	III PART NAME ASSIGNED BY CONTROLLING AGENCY	TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER