Request a Quote on Huntron Inc Part 5-627 with the NSN 6625-01-217-7608

Part Number: 5-627

Alternate P/N: 5627

Manufacturer: Huntron Inc

NSN: 6625-01-217-7608

NIIN: 012177608

Item Name : Test Set Electronic

CAGE Code: 57705

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country : USA

NCB Code : 01

Thank you for taking interest in Huntron Inc part number 5-627, which is listed with the NSN 6625-01-217-7608 and a product description of “Test Set Electronic.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.

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Characteristics Data of NSN 6625-01-217-7608, 6625012177608

MRC	Criteria	Characteristic
FEAT	SPECIAL FEATURES	HAS 3 SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATES ON 120/230 VAC, 50/60 HZ, SINGLES PHASE; COMES W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE OF MEDICAL EQUIPMENT; HAS PULSE GENERATION CAPABILITIES W/A SELECTABLE RANGE FROM 60 HZ TO 2 KHZ; OUTPUT AMPLITUDE AT LEAST 0 TO 5 VOLTS PEAK, CURRENT UP TO 50 MA AND IMPEDANCE OF 100 OHMS; UNIT SELECTOR SWITCH(S)/TERMINALS DESCRIBE FUNCTION, RANGE AND/OR TEST; PROVISIONED AS FOLLOWS: DPSC-A SPECIAL EQUIPMENT COMMERCIAL SERVICE MANUAL; DPSC-B SPECIAL EQUIPMENT COMMERCIAL OPERATING/INSTRUCTION MANUAL; DI-ILSS-80867 SPECIAL EQUIPMENT CONSUMABLE/DURABLE SUPPORT ITEM LIST
TEXT	GENERAL CHARACTERISTICS ITEM DESCRIPTION	FOR TESTING CAPACITORS FOR SHORTS, OPENS, AND LEAKAGE FROM 0.001 TO 25 MICRO FARADS. TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS. TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE, SHORTS AND OPEN BONDING, TO INCLUDE ZENOR DIODES, BIPOLAR TRANSISTORS, TRIACS, AND OPTEOELECTRONIC DEVICES. TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE.
CXCY	III PART NAME ASSIGNED BY CONTROLLING AGENCY	TEST SET ELECTRONIC CIRCUIT-COMPONENT: 105-130V 50/60HZ