Thank you for taking interest in Bae Systems Inc part number 1372FW1104-001, which is listed with the NSN 5962-01-373-5204 and a product description of “Microcircuit Memory.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-373-5204 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013735204 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
1372FW1104-001 | 5 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
ADAU | BODY HEIGHT | 0.180 INCHES MINIMUM AND 0.200 INCHES MAXIMUM |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,PROGRAMMED |
CZER | MEMORY DEVICE TYPE | PAL |
ADAT | BODY WIDTH | 0.290 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQZP | INPUT CIRCUIT PATTERN | 22 INPUT |
CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEQ | TIME RATING PER CHACTERISTIC | 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT AND 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT |
ADAQ | BODY LENGTH | 1.260 INCHES MINIMUM AND 1.280 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | EO LOROPS |
CBBL | FEATURES PROVIDED | BURN IN AND COMPATIBLE CMOS AND ERASABLE AND ELECTROSTATIC SENSITIVE AND PROGRAMMED AND HERMETICALLY SEALED AND W/CLOCK |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
FEAT | SPECIAL FEATURES | ELECTROSTATIC DISCHARGE SENSITIVE; ALTERED ITEM,MADE FROM 5962-8686401LA,PROGRAMMED PER 1058-U37.JED,FD137200104-001,CHECKSUM 36C6; NHA PN 1372AE1058 |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
AFJQ | STORAGE TEMP RANGE | -65.0/150.0 DEG CELSIUS |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-9 MIL-M-38510 |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -2.0 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
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