Thank you for taking interest in American Technical Ceramics Corp part number ATC100B6R8CP500X, which is listed with the NSN 5910-01-476-8897 and a product description of “Capacitor Fixed Ceramic Dielectr.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.
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| MRC | Criteria | Characteristic |
|---|---|---|
| CQLZ | Temp Coefficient Of Capacitance Per Section In Ppm Per Deg Celsius | 90.0 SINGLE SECTION |
| AEBZ | Schematic Diagram Designator | NO COMMON OR GROUNDED ELECTRODE(S) |
| CRTP | Tolerance Range Per Section | -0.10/+0.10 PICOFARADS SINGLE SECTION |
| CWPK | Insulation Resistance At Reference Temp | 1000000.0 MEGOHMS |
| ADAT | Body Width | 0.090 INCHES MINIMUM AND 0.130 INCHES MAXIMUM |
| CWSG | Terminal Surface Treatment | NICKEL |
| CQJJ | Nonderated Operating Temp | -55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| ADAQ | Body Length | 0.090 INCHES MINIMUM AND 0.145 INCHES MAXIMUM |
| MRC | Decoded Requirement | Clear Text Reply |
| CRHD | Tolerance Of Temp Coefficient Per Section In Ppm Per Deg Celsius | -20.0/+20.0 SINGLE SECTION |
| TTQY | Terminal Type And Quantity | 2 BONDING PAD |
| CQBF | Insulation Resistance At Maximum Operating Temp | 100000.0 MEGOHMS |
| AAQL | Body Style | CHIP TYPE |
| AARG | Reliability Indicator | NOT ESTABLISHED |
| CWJK | Case Material | CERAMIC |
| CQBQ | Capacitance Value Per Section | 6.800 PICOFARADS SINGLE SECTION |
| CQWM | Nonderated Continuous Voltage Rating And Type Per Section | 500.0 DC SINGLE SECTION |
| ADAU | Body Height | 0.102 INCHES MAXIMUM |
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