| Item Name | Test Set Memory Loa |
| Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
| Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
| National Item Identification Number (NIIN) | 01-233-9862 (012339862) |
| NCB Code | USA (01) |
| Manufacturer | General Semiconductor Inc |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 888-9370-2 | general semiconductor inc | test set memory loa | 14936 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| TEXT | GENERAL CHARACTERISTICS ITEM DESCRIPTION | PROGRAM CAPABILITY 496 WORDS BY 24 BITS,INPUT 115.0 VAC,50.0 TO 420.0 HZ,SINGLE PHASE OUTPUT 5.0 VDC FOR LOGIC SECTION,24.0 VDC FOR MEMERY SECTION,O/A DIA. 18.000 IN. LG,12.000 IN. W,13.500 IN. HGT |
| Relevant Components for NSN - 6625-01-233-9862, 6625012339862 | ||||
| 6685-01-496-6945 (6685014966945) | 6625-00-991-5146 (6625009915146) | 6695-01-165-6856 (6695011656856) | 6680-01-394-7022 (6680013947022) | |
| 6625-01-522-6958 (6625015226958) | 6685-00-756-9537 (6685007569537) | 6615-01-509-3109 (6615015093109) | 6605-01-382-7819 (6605013827819) | |
| 6625-00-133-7757 (6625001337757) | 6685-00-282-6671 (6685002826671) | 6685-01-611-3893 (6685016113893) | 6625-00-543-2919 (6625005432919) | |
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