| Item Name | Test Set Semiconduc |
| Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
| Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
| National Item Identification Number (NIIN) | 00-179-5844 (001795844) |
| NCB Code | USA (00) |
| Manufacturer | Joint Electronics Type Designation System, Hickok Incorporated |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 902-470 | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
| 902-470 | hickok incorporated | test set semiconduc | 28569 | RFQ |
| ANUSM206A | hickok incorporated | test set semiconduc | 28569 | RFQ |
| ANUSM206A | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
| ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
| FAAZ | PHASE | SINGLE |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
| AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
| ABRY | LENGTH | 9.000 INCHES NOMINAL |
| ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
| AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
| AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
| AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
| AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| HGTH | HEIGHT | 10.000 INCHES NOMINAL |
| AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
| ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
| ABGL | WIDTH | 8.000 INCHES NOMINAL |
| Relevant Components for NSN - 6625-00-179-5844, 6625001795844 | ||||
| 6685-01-496-6945 (6685014966945) | 6625-00-991-5146 (6625009915146) | 6695-01-165-6856 (6695011656856) | 6680-01-394-7022 (6680013947022) | |
| 6625-01-522-6958 (6625015226958) | 6685-00-756-9537 (6685007569537) | 6615-01-509-3109 (6615015093109) | 6605-01-382-7819 (6605013827819) | |
| 6625-00-133-7757 (6625001337757) | 6685-00-282-6671 (6685002826671) | 6685-01-611-3893 (6685016113893) | 6625-00-543-2919 (6625005432919) | |
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