| Item Name | Semiconductordeviceset |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
| National Item Identification Number (NIIN) | 00-163-3712 (001633712) |
| NCB Code | USA (00) |
| Manufacturer | Hewlett-Packard Company, Harris Corporation, Avago Technologies Us Inc, Raytheon Company, Rohde And Schwarz Inc, Thales Defense And Security Inc |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 5082-2804 | hewlett-packard company | semiconductordeviceset | 28480 | RFQ |
| 5082-2698 | hewlett-packard company | semiconductordeviceset | 28480 | RFQ |
| 2139735G001 | harris corporation | semiconductordeviceset | 28527 | RFQ |
| 5082-2698 | avago technologies us inc | semiconductordeviceset | 50434 | RFQ |
| 535765-1 | raytheon company | semiconductordeviceset | 96214 | RFQ |
| AE0128724 | rohde and schwarz inc | semiconductordeviceset | d0894 | RFQ |
| 246246-0001 | thales defense and security inc | semiconductordeviceset | 65597 | RFQ |
| 5082-2804 | avago technologies us inc | semiconductordeviceset | 50434 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | GLASS ALL SEMICONDUCTOR DEVICE DIODE |
| ABHP | OVERALL LENGTH | 0.170 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ADAV | OVERALL DIAMETER | 0.076 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| AFZC | FUNCTION FOR WHICH DESIGNED | GENERAL PURPOSE |
| AGAV | END ITEM IDENTIFICATION | NAVSTAR GLOBAL POSITIONING SYSTEM USER EQUIPMENT (UE); VERSATILE AVIONICS SHOP TEST (VAST) SYSTEMS; 485L TACS |
| ALAS | INTERNAL CONFIGURATION | JUNCTION CONTACT ALL SEMICONDUCTOR DEVICE DIODE |
| ASCQ | INTERNAL JUNCTION CONFIGURATION | PN ALL SEMICONDUCTOR DEVICE DIODE |
| ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 70.0 MINIMUM BREAKDOWN VOLTAGE,DC ALL SEMICONDUCTOR DEVICE DIODE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 15.00 MILLIAMPERES SOURCE CUTOFF CURRENT PRESET ALL SEMICONDUCTOR DEVICE DIODE |
| CTRD | POWER RATING PER CHARACTERISTIC | 250.0 MILLIWATTS MAXIMUM TOTAL POWER DISSIPATION ALL SEMICONDUCTOR DEVICE DIODE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE |
| FEAT | SPECIAL FEATURES | WEAPON SYSTEM ESSENTIAL |
| TTQY | TERMINAL TYPE AND QUANTITY | 4 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE |
| Relevant Components for NSN - 5961-00-163-3712, 5961001633712 | ||||
| 5975-01-629-6429 (5975016296429) | 5998-01-305-2341 (5998013052341) | 5930-01-584-0809 (5930015840809) | 5962-01-210-3065 (5962012103065) | |
| 5905-00-175-4284 (5905001754284) | 5950-01-458-0903 (5950014580903) | 5920-01-490-0904 (5920014900904) | 5998-01-475-9891 (5998014759891) | |
| 5995-01-575-7529 (5995015757529) | 5962-01-310-7304 (5962013107304) | 5935-01-240-1468 (5935012401468) | 5995-01-374-0247 (5995013740247) | |
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